oval type led lamps ligitek electronics co.,ltd. property of ligitek only pb lead-free parts lwk22843z/s15-a03/tbs-2 lwk22843z/s15-a03/tbs-2 a - 2011 01 -jun. doc. no : qw0905- rev. : date : data sheet l dcc
1/7 page lwk22843z/s15-a03/tbs-2 part no. ligitek electronics co.,ltd. property of ligitek only note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. lwk22843z/s15-a03-tbs-2 2.54typ 1.5max 6.3 3.8 25.0min 0.5 typ 1.0min 9.6 0.5 4.0 w3 w2 w1 w0 l h1 h2 p2 - + t f p1 d p h package dimensions - + wk zener
ligitek electronics co.,ltd. property of ligitek only absolute maximum ratings at ta=25 # typical electrical & optical characteristics (ta=25 # ) note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. tstg storage temperature part nomaterial lwk22843z/s15-a03/tbs-2 emitted ingan/gan white lens color i f forward current operating temperature reverse current @5v power dissipation peak forward current duty 1/10@10khz topr ir pd i fp parameter symbol -30~ +100 luminous intensity @20ma(mcd) viewing angle 2 $ 1/2 (deg) forward voltage @20ma(v) 3.4 3.1 max. 2200 1800 min. typ. # page 2/7 30 ma -20~ +80 50 # % a 120 100 ma mw wk ratings unit chromaticity coordinates x y 0.310.31 v 8000 esd electrostatic discharge typ. part no. lwk22843z/s15-a03/tbs-2 water clear horizontal axis 76 & vertical axis 100 &
ligitek electronics co.,ltd. property of ligitek only page 3/7 . chromaticity coordinates specifications for bin grading . cie chromaticity diagram part no. lwk22843z/s15-a03/tbs-2 bin x y c1 c2 0.31 0.340 0.31 0.300 0.32 0.315 0.32 0.355 0.32 0.355 0.32 0.315 0.33 0.330 0.33 0.370 2200 1800 max group min 2200 2700 2700 3400 3400 4000 4000 5000 a24 a25 a26 a27 a28 b5 0.30 0.30 0.31 0.31 0.340 0.300 0.285 0.325
page 4/7 inch 0.08 0.12 0.43 1.42 0.89 0.17 0.3 0.51 0.23 0.38 0.61 0.06 0.75 0.16 h inch symbol mm minimum ------- 0.09 w0 ------- 0.85 ? ?
fig.5 relative intensity vs.wavelength(ta=25 # ) typical electro-optical characteristics curve 04060 0 i n t e n s i t y wavelength (nm) 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 # f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 # 20 ambient temperature( # ) ambient temperature( # ) 0 -20 -40 0.8 0 -40-20 100 80 60 40 20 0.0 60100 80 40 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 i v ( m c d ) f o r w a r d v o l t a g e ( v ) current(ma) forward current(ma) 20020 0 60100 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage wk chip 420 0 page 5/7 ligitek electronics co.,ltd. property of ligitek only part no. lwk22843z/s15-a03/tbs-2 radiation angle(0.5):h 76degree/v 100 degree fig.6 directivity radiation 25% -60 & 100%75%50% 0 25% vertical axis 100 & -30 & 0 & 100% 75% 50% 60 & horizontal axis 76 & 30 & 80 40 1 2 3 4 80100 80 160 240 320 400 430440450460470480490500510520540 500 1000 1500 2000 2500 3000 3500 4000
260 & note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 2
the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hours. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. thermal shock test 1.ta=105 # 5 # &-40 # 5 # (10min) (10min) 2.total 10 cycles 1.t.sol=230 # 5 # 2.dwell time=5 1sec solderability test 1.t.sol=260 # 5 # 2.dwell time= 10 1sec. solder resistance test 1.ta=65
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