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| Philips Semiconductors Products Product specification 13-input NAND Gate FAST 74F133 FAST Products PRODUCT SPECIFICATION TYPE 74F133 TYPICAL PROPAGATION DELAY 4.0ns TYPICAL SUPPLY CURRENT (TOTAL) 2.0 mA ORDERING INFORMATION ORDER CODE COMMERCIAL RANGE DESCRIPTION VCC = 5V 10%, Tamb = 0C to +70C 16-pin plastic DIP 16-pin plastic SO N74F133N N74F133D INDUSTRIAL RANGE VCC = 5V 10%, Tamb = -40C to +85C I74F133N I74F133D INPUT AND OUTPUT LOADNG AND FAN OUT TABLE PINS DO - D12 Data inputs DESCRIPTION 74F (U.L.) HIGH/LOW 1.0/1.0 50/33 LOAD VALUE HIGH/LOW 20A/0.6mA 1.0mA/20mA Q Data output Note to input and output loading and fan out table 1. One (1.0) FAST unit load is defined as: 20A in the high state and 0.6mA in the low state. PIN CONFIGURATION LOGIC SYMBOL LOGIC SYMBOL (IEEE/IEC) 1 2 D0 D1 D2 D3 D4 D5 D6 GND 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 1 2 3 4 5 6 7 10 11 12 13 14 15 & VCC D12 D11 D10 D9 D8 D7 Q 3 4 5 6 7 10 11 12 13 14 15 9 VCC = Pin 16 GND = Pin 8 July 2, 1993 1 853-10219 Philips Semiconductors Products Product specification 13-input NAND Gate FAST 74F133 LOGIC DIAGRAM D0 1 D1 2 D2 3 D3 4 D4 5 D5 6 D6 7 D7 10 11 12 13 14 15 D8 D9 D10 D11 D12 9 VCC = Pin 16 GND = Pin 8 Q FUNCTION TABLE INPUTS DO H D1 H D2 H D3 H D4 H D5 H D6 H D7 H D8 H D9 H D10 H D11 H D12 H OUTPUT Q L H Any one input = L July 2, 1993 2 Philips Semiconductors Products Product specification 13-input NAND Gate FAST 74F133 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL PARAMETER RATING UNIT VCC VIN IIN VOUT IOUT Tamb Supply voltage Input voltage Input current Voltage applied to output in high output state Current applied to output in low output state Operating free air temperature range Commercial range Industrial range Tstg Storage temperature range -0.5 to +7.0 -0.5 to +7.0 -30 to +5 -0.5 to VCC 40 0 to +70 -40 to +85 -65 to +150 V V mA V mA C C C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER MIN VCC VIH VIL IIk IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free air temperature range Commercial range Industrial range 0 -40 4.5 2.0 0.8 -18 -1 20 +70 +85 LIMITS NOM 5.0 MAX 5.5 V V V mA mA mA UNIT C C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 MIN VOH High-level output voltage VCC = MIN, VIL = MAX VIH = MIN, IOH = MAX VOL Low-level output voltage VCC = MIN, VIL = MAX VIH = MIN, IOl = MAX VIK II IIH IIL IOS ICC Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Short-circuit output current3 ICCH VCC = MIN, II = IIK VCC = MAX, VI = 7.0V VCC = MAX, VI = 2.7V VCC = MAX, VI = 0.5V VCC = MAX VCC = MAX -60 1.0 LIMITS TYP2 MAX V 3.4 0.35 0.35 -0.73 0.50 0.50 -1.2 100 20 -0.6 -150 2.0 V V V V A A mA mA mA UNIT 10%VCC 5%VCC 10%VCC 5%VCC 2.5 2.7 Supply current (total) ICCL VCC = MAX 2.5 4.0 mA NOTES: 1.. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25C. 3.. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. July 2, 1993 3 Philips Semiconductors Products Product specification 13-input NAND Gate FAST 74F133 AC ELECTRICAL CHARACTERISTICS LIMITS Tamb = +25C SYMBOL PARAMETER TEST CONDITION VCC = +5.0V CL = 50pF, RL = 500 MIN tPLH tPHL Propagation delay Dn to Qn Waveform 1 2.0 2.5 TYP 4.0 4.5 MAX 7.0 7.5 Tamb = 0C to +70C VCC = +5.0V 10% CL = 50pF, RL = 500 MIN 1.5 2.0 MAX 7.5 8.0 Tamb = -40C to +85C VCC = +5.0V 10% CL = 50pF, RL = 500 MIN 1.5 2.0 MAX 7.5 8.0 ns UNIT AC WAVEFORMS Dn VM tPHL VM tPLH Q VM VM Waveform 1. Propagation delay for data to output Note to AC Waveforms 1. For all waveforms, VM = 1.5V. TEST CIRCUIT AND WAVEFORMS VCC 90% VIN PULSE GENERATOR RT D.U.T. VOUT NEGATIVE PULSE VM 10% tTHL (tf ) CL RL tTLH (tr ) 90% POSITIVE PULSE 10% tTHL (tf ) AMP (V) 90% VM tw 10% 0V tw VM 10% tTLH (tr ) 0V 90% AMP (V) Test circuit for totem-pole outputs VM DEFINITIONS: RL = Load resistor; see AC electrical characteristics for value. CL = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. RT = Termination resistance should be equal to ZOUT of pulse generators. Input pulse definition INPUT PULSE REQUIREMENTS family amplitude vM 74F 3.0V 1.5V rep. rate 1MHz tw tTLH tTHL 2.5ns 500ns 2.5ns July 2, 1993 4 |
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