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MAX14720 WFF840B RC120 SZA1000 RC120 STPS1L4 D4N03 5253B
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    AN04 AN004

Cirrus Logic
Part No. AN04 AN004
OCR Text ...how minor deviations in voltage due to 1/f noise in circuit components. These deviations are usually small and are superimposed on a larger drift characteristic which is due to device aging. An example of this is seen in Figure 1. Long term...
Description Voltage References for Crystal A/D Converters
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File Size 158.47K  /  12 Page

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    AN07 AN007

Cirrus Logic
Part No. AN07 AN007
OCR Text ...illoscope. Impedance mismatches due to coax test cables, probes, test leads, or any other leads connected to the line will cause reflections. Data Pattern The first step in measuring pulse shapes is to notice that the T1 specifications call...
Description Measurement and Evaluation of Pulse Shapes in T1/E1 Transmission Systems
From old datasheet system

File Size 212.74K  /  12 Page

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    AN158

Cirrus Logic
Part No. AN158
OCR Text ...ection. Charge injection occurs due to inherent mismatch of the chopping switches in the chopper circuitry of the amplifier. The magnitude of the CVF current is a function of the frequency used to operate the chopping switches. The CS552x f...
Description Measuring High Voltages (5 to 1,000 Volts) with the CS5521/22/23/24/28 and CS5525/26 A/D Converters
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File Size 57.28K  /  4 Page

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    AN36

Cirrus Logic
Part No. AN36
OCR Text ...ize possible damage to the gage due to overstress. A strain gage is a passive electrical device. Most often gages are configured in a Wheatstone bridge configuration to enhance their sensitivity while minimizing the effects of drift. The br...
Description CS5516 and CS5520: Overcoming Errors in Bridge Transducer Measurement
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File Size 70.71K  /  6 Page

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