|
|
|
SGS Thomson Microelectronics
|
Part No. |
AN565
|
OCR Text |
...n under the RF conditions using elevated device junction temperature (Tj) as the accelerating factor. The test matrix consists of a total of nine (9) separate tests. For the MSC-1330/A device, the MTF was measured under two (2) pulse condit... |
Description |
MEDIAN-TIME-TO-FAILURE (MTF) OF A L-BAND POWER TRANSISTOR UNDER RF CONDITIONS
|
File Size |
160.57K /
16 Page |
View
it Online |
Download Datasheet |
|
|
|
Samtec, Inc
|
Part No. |
ASP-142781-01
|
OCR Text |
... .005[.13] .xxxx: .0020[.051] elevated qms assm (22mm stack) by: asp-142781-01 dwg. no. description: proprietary note this document contains information confidential and proprietary to samtec, inc. and shall not be reproduced or transfer... |
Description |
1. .608 STACKER HEIGHT NOT AVAILABLE AS STANDARD.
|
File Size |
355.61K /
3 Page |
View
it Online |
Download Datasheet |
|
Price and Availability
|