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				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F2245D N74F2245DB N74F2245N 74F2245
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Octal transceiver with 30ohm equivalent output termination 3-State
File Size	97.65K / 10 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F225D N74F225N 74F225
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	16X5 asynchronous FIFO 3-State
File Size	114.75K / 14 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors]
Part No.	N74F260 N74F260D N74F260N 74F260 74F260_2
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	From old datasheet system Dual 5-input NOR gate
File Size	68.85K / 8 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	N74F269 N74F269D N74F269DB N74F269N 74F269 74F269_2
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	From old datasheet system 8-bit bidirectional binary counter
File Size	118.22K / 14 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F534D N74F534N 74F533 74F534
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Latch/flip-flop
File Size	97.37K / 12 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F537D N74F537N 74F537
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed la...
Description	1-of-10 decoder 3-State
File Size	47.75K / 5 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors N.V.
Part No.	N74F538D N74F538N 74F538
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed la...
Description	1-of-8 decoder (3-State) 1-of -8 decoder (3?state) 1-of -8 decoder 3-state F/FAST SERIES, OTHER DECODER/DRIVER, CONFIGURABLE OUTPUT, PDIP20
File Size	85.81K / 10 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F539D N74F539N 74F539
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed la...
Description	Dual 1-of-4 decoder 3-State
File Size	40.54K / 5 Page	View it Online	Download Datasheet

				NXP Semiconductors N.V. PHILIPS[Philips Semiconductors]
Part No.	N74F620D N74F620N N74F623N 74F620 74F623 N74620D N74620N N74623D N74623N N74F623D 74F620_623_1
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Octal bus transceiver, inverting 3tate 八路总线收发器，反相3tate Octal bus transceiver, non-inverting (3-State)(八通道总线收发器，同向（三态）) Octal bus transceiver / inverting 3tate From old datasheet system
File Size	96.71K / 12 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	N74F640 N74F640D N74F640N 74F640 74F640_2
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Octal bus transceiver / inverting 3-State From old datasheet system Octal bus transceiver, inverting (3-State) Octal bus transceiver, inverting 3-State Octal bus transceiver inverting 3-State
File Size	85.22K / 11 Page	View it Online	Download Datasheet

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